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hal-01851851v1  Conference papers
Nicolas RoussoulyMichel SalaünFrank PetitjeanFabrice BuffeAnne Carpine. Reliability approach in spacecraft structures
ECSSMMT 2009 - 11th European Conference on Spacecraft Structures, Materials and Mechanical Testing, Sep 2009, Toulouse, France. pp.0
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hal-01680275v1  Conference papers
Marco WincklerMarta LarusdottirKati KuusinenCristian BogdanPhilippe Palanque. Dealing with Conflicting User Interface Properties in User-Centered Development Processes
16th IFIP Conference on Human-Computer Interaction (INTERACT), Sep 2017, Bombay, India. pp.521-523
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tel-00538717v1  Theses
Mohamed Matmat. Pour une approche complète de l'évaluation de fiabilité dans les microsystèmes
Micro et nanotechnologies/Microélectronique. INSA de Toulouse, 2010. Français
hal-01187212v1  Conference papers
Golam SarwarPierre Ugo TournouxRoksana BoreliEmmanuel Lochin. eCMT-SCTP: Improving performance of multipath SCTP with erasure coding over lossy links
2013 IEEE 38th Conference on Local Computer Networks (LCN), Oct 2013, Sydney, Australia. pp.476--483, ⟨10.1109/LCN.2013.6761281⟩
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tel-01946859v1  Theses
Marianne, Amemagne Diatta. Fiabilité des diodes de protection ESD soumises à des décharges électrostatiques répétitives
Micro et nanotechnologies/Microélectronique. Université Toulouse 3 Paul Sabatier (UT3 Paul Sabatier), 2012. Français
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inria-00586360v1  Conference papers
Amadou Baba BagayokoBéatrice Paillassa. Comparaison des stratégies de redondance dans les réseaux ad hoc
CFIP 2011 - Colloque Francophone sur l Ingénierie des Protocoles, UTC, May 2011, Sainte Maxime, France
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tel-00142309v1  Theses
Laurent Jalabert. Ingénierie de grille pour application à la micro-électronique MOS sub-micronique
Micro et nanotechnologies/Microélectronique. Université Paul Sabatier - Toulouse III, 2001. Français
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hal-02131990v1  Conference papers
Manuel González-SentísPatrick TounsiAlain BensoussanArnaud Dufour. Drift effects and trap analysis of power-GaN-HEMT under switching power cycling
Science of Electronics, Technologies of Information and Telecommunication, SETIT’18, Dec 2018, Hammamet, Tunisia
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tel-00142168v1  Habilitation à diriger des recherches
Mohamed Kaâniche. Evaluation de la sûreté de fonctionnement informatique. Fautes physiques, fautes de conception, malveillances
Réseaux et télécommunications [cs.NI]. Institut National Polytechnique de Toulouse - INPT, 1999
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tel-00142181v1  Theses
Mohamed Kaâniche. Modèle hyperexponentiel en temps continu et en temps discret pour l'évaluation de la croissance de la sûreté de fonctionnement
Réseaux et télécommunications [cs.NI]. Institut National Polytechnique de Toulouse - INPT, 1992. Français
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hal-01157169v1  Journal articles
Muhammad Imran Khan. Network parameters impact on dynamic transmission power control in vehicular ad hoc networks
International Journal of Next-Generation Networks, 2013, vol. 5 (n° 3), pp. 1-22. ⟨10.5121/ijngn.2013.5301⟩
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hal-00907447v1  Conference papers
Jean-Guy Tartarin. Diagnostic Tools For Accurate Reliability Investigations of GaN Devices
21st International Conference on Noise and Fluctuations (ICNF 2011) by Institute of Electrical and Electronics Engineers ( IEEE ), Jun 2011, Toronto, Canada
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hal-01906101v1  Conference papers
Sandra DevinCamille VrignaudKathleen BelhasseinAurélie ClodicOphélie Carreras et al.  Evaluating the Pertinence of Robot Decisions in a Human-Robot Joint Action Context: The PeRDITA Questionnaire
27th IEEE International Conference on Robot and Human Interactive Communication (RO-MAN 2018), Aug 2018, Nanjing, China. ⟨10.1109/ROMAN.2018.8525785⟩
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hal-01771624v1  Conference papers
Virgil DumbravaPaul UlmeanuPhilippe DuquenneCristian LazaroiuMircea Scutariu. Expansion planning of distribution networks by heuristic algorithms
Universities Power Engineering Conference, Aug 2010, Cardiff, United Kingdom. pp. 1-6
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hal-00851763v1  Conference papers
Mohamed KaânicheKarama Kanoun. The discrete time hyperexponential model for software reliability growth evaluation
Third International Symposium on Software Reliability Engineering (ISSRE-1992), Oct 1992, Research Triangle Park, NC, United States. pp.64 - 75, ⟨10.1109/ISSRE.1992.285857⟩
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hal-02180839v1  Conference papers
Frédéric RichardeauFrançois BoigeStéphane Lefebvre. Gate leakage-current, damaged gate and open-circuit failure-mode of recent SiC Power Mosfet : Overview and analysis of unique properties for converter protection and possible future safety management
2018 IEEE International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC), Nov 2018, Nottingham, France. pp.1-6, ⟨10.1109/ESARS-ITEC.2018.8607551⟩
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hal-02180574v1  Conference papers
François BoigeFrédéric RichardeauStéphane LefebvreJean-Marc BlaquièreGerard Guibaud et al.  Ensure an original and safe “fail-to-open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ), Oct 2018, Aalborg, Denmark. pp.598-603, ⟨10.1016/j.microrel.2018.07.026⟩
hal-00713206v1  Journal articles
Vanessa SmetFrançois ForestJean-Jacques HuselsteinFrédéric RichardeauZoubir Khatir et al.  Ageing and Failure Modes of IGBT Modules in High Temperature Power Cycling
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2011, 58 (10), pp.4931 - 4941. ⟨10.1109/TIE.2011.2114313⟩
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hal-01709192v1  Conference papers
Farah SalamehAntoine PicotPascal MaussionMarie Chabert. Hybrid parametric/non-parametric models for lifespan modeling of insulation materials
13th International Conference on Condition Monitoring and Machinery Failure Prevention Technologies (CM 2016/MFPT 2016), Oct 2016, Paris, France. pp. 25-31
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tel-00797045v1  Theses
Nuria Torres-Matabosch. Design for reliability applied to RF-MEMS devices and circuits issued from different TRL environments
Micro and nanotechnologies/Microelectronics. Université Paul Sabatier - Toulouse III, 2013. English
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tel-00160966v1  Theses
Christian Caramel. Nouvelles fonctions interrupteurs intégrées pour la conversion d'énergie
Micro et nanotechnologies/Microélectronique. Université Paul Sabatier - Toulouse III, 2007. Français