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hal-00936080v1  Journal articles
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikael Deobarro. IC immunity modeling process validation using on-chip measurements
Journal of Electronic Testing, Springer Verlag, 2012, 28 (3), pp.339-348. ⟨10.1007/s10836-012-5294-3⟩
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hal-00945301v1  Conference papers
Alexandre Boyer, Sonia Ben Dhia. Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195, ⟨10.1109/EMCCompo.2013.6735199⟩
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hal-00936086v1  Journal articles
Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon. Prediction of Long-Term Immunity of a Phase-Locked Loop
Journal of Electronic Testing, Springer Verlag, 2012, 28 (6), pp.791-802. ⟨10.1007/s10836-012-5335-y⟩
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hal-00350350v1  Conference papers
Philippe Menini, Patrick Pons, C. Douziech, P. Favaro, G. Blasquez et al.  Oscilllator synchronisation problem in a BiCMOS analog-digital integrated circuit dedicated to a capacitive pressure sensor
6th international conference MIXDES'99, Jun 1999, Cracovie, Poland. pp.223-228
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hal-01574387v2  Conference papers
Sébastien Serpaud, Chaimae Ghfiri, Alexandre Boyer, A Durier. Proposal for combined conducted and radiated emission modelling for Integrated Circuit
11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), Jul 2017, Saint-Petersbourg, Russia. pp.172-177, ⟨10.1109/EMCCompo.2017.7998105⟩

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