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	hal-02005757v1 Journal articles M. Azib, F. Baudoin, Nicolas Binaud, C. Villeneuve-Faure, G. Teyssedre et al. Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud Journal of Applied Physics, American Institute of Physics, 2019, 125 (4), pp.045305. ⟨10.1063/1.5060655⟩
	hal-02005747v1 Conference papers M. Azib, F. Baudoin, C. Villeneuve-Faure, G. Teyssedre, Nicolas Binaud et al. Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D 2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, Hungary. pp.1-4, ⟨10.1109/ICD.2018.8514685⟩
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