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hal-02088561v1  Journal articles
Mengyi ZhangAlban GoupilAnas HanafTian Wang. Distributed Harmonic Form Computation
IEEE Signal Processing Letters, Institute of Electrical and Electronics Engineers, 2018, 25 (8), pp.1241-1245. ⟨10.1109/LSP.2018.2850525⟩
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Gaolei ZhanMarc DuboisYounes MakoudiSimon LamareJudicaël Jeannoutot et al.  Influence of Halogen Bonds on the Compactness of Supramolecular Assemblies on Si(111)‑B
Journal of Physical Chemistry C, American Chemical Society, 2017, 121, pp.8427 − 8434
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Thomas VoisinJean-Philippe MonchouxMarc ThomasChristophe DeshayesAlain Couret. Mechanical Properties of the TiAl IRIS Alloy
Metallurgical and Materials Transactions A, Springer Verlag/ASM International, 2016, 47 (12), p. 6097-6108. ⟨10.1007/s11661-016-3801-3⟩
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Abdullah SirindilRaphael KoboldFrédéric MompiouSylvie Lartigue-KorinekLoïc Perrière et al.  Atomic scale analyses of {\bb Z}-module defects in an NiZr alloy
Acta Crystallographica Section A Foundations and Advances, International Union of Crystallography, 2018, 74 (6), pp.647-658. ⟨10.1107/S2053273318011439⟩
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R. SerraLuigi GaribaldiNuno MaiaMarc Thomas. Experimental Shock and Vibration Analysis
Shock and Vibration, IOS Press, 2015, 2015, pp.1-1. ⟨10.1155/2015/796736⟩
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S. RubinoP. SchattschneiderM. Stöger-PollachC. HebertJ. Rusz et al.  Energy-loss magnetic chiral dichroism (EMCD): Magnetic chiral dichroism in the electron microscope
Journal of Materials Research, Cambridge University Press (CUP), 2008, 23 (10), pp.2582 - 2590. ⟨10.1557/JMR.2008.0348⟩
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Charles RenardN. CherkasinAlexandre JaffréLaetitia VincentA. Michel et al.  Dislocation and antiphase domain free microscale GaAs crystals grown on SiO2 from (001) Si nano-areas
Applied Physics Letters, American Institute of Physics, 2013, 102 (19), pp.191915 - 191915-4. ⟨10.1063/1.4807386⟩
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Thanh Tra NguyenCédric RobertAntoine LétoublonC. CornetThomas Quinci et al.  Synchrotron X-ray diffraction analysis for quantitative defect evaluation in GaP/Si nanolayers
Thin Solid Films, Elsevier, 2013, Current Trends in Optical and X-Ray Metrology of Advanced Materials for Nanoscale Devices III, 541, pp.36-40. ⟨10.1016/j.tsf.2012.11.116⟩
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Wei LuTony RohelNicolas BertruHervé FolliotCyril Paranthoen et al.  Achievement of InSb Quantum Dots on InP(100) Substrates
Japanese Journal of Applied Physics, part 1 : Regular papers, Short Notes, 2010, 49, pp.060210-1. ⟨10.1143/JJAP.49.060210⟩
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Larysa KhomenkovaChristian DufourPierre-Eugène CoulonCaroline BonafosF. Gourbilleau. Stable HfO2-based Layers Fabricated by RF Magnetron Sputtering
ECS Transactions, Electrochemical Society, Inc., 2009, 25 (6), pp.153-162
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J. KacherC. KirchlechnerJ. MichlerE. PolatidisR. Schwaiger et al.  Impact of in situ nanomechanics on physical metallurgy
MRS Bulletin, Cambridge University Press (CUP), 2019, 44 (06), pp.465-470. ⟨10.1557/mrs.2019.124⟩
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V. GrusonSébastien J. WeberL. BarreauJ.-F. HergottF. Lepetit et al.  Interferometric control of the ellipticity of a femtosecond extreme ultraviolet source
Journal of the Optical Society of America B, Optical Society of America, 2018, 35 (4), ⟨10.1364/JOSAB.35.000A15⟩
hal-01742015v1  Journal articles
A. GouyeFlorian HüeA. HalimaouiO. KermarrecY. Campidelli et al.  Selective growth of tensily strained Si1−yCy films on patterned Si substrates
Materials Science in Semiconductor Processing, Elsevier, 2009, 12 (1-2), pp.34 - 39. ⟨10.1016/j.mssp.2009.07.006⟩