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hal-02324475v1  Conference papers
M. BelhajK. MakashevaG. TeyssedreD. Payan. Effect of charging on the secondary electron emission
2016 IEEE International Conference on Plasma Science (ICOPS), Jun 2016, Banff, Canada. pp.1-1, ⟨10.1109/PLASMA.2016.7534063⟩
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hal-02324471v1  Conference papers
F. MortreuilC. Villeneuve-FaureL. BoudouK. MakashevaG. Teyssedre. Charges injection investigation at metal/dielectric interfaces by Kelvin Probe Force Microscopy
2016 IEEE International Conference on Dielectrics (ICD), Jul 2016, Montpellier, France. pp.493-496, ⟨10.1109/ICD.2016.7547650⟩
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hal-02324322v1  Journal articles
G. TeyssedreS. LiK. MakashevaN. ZhaoL. Milliere et al.  Interface tailoring for charge injection control in polyethylene
IEEE Transactions on Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers, 2017, 24 (3), pp.1319-1330. ⟨10.1109/TDEI.2017.006142⟩
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hal-02324440v1  Conference papers
K. MakashevaM. BelhajG. TeyssedreC. RigoudyS. Dadouch et al.  On the secondary electron emission phenomenon when originating from very thin layers
2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO), Jul 2017, Pittsburgh, United States. pp.515-516, ⟨10.1109/NANO.2017.8117275⟩
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hal-02324437v1  Conference papers
G. TeyssedreS. LiK. MakashevaN. ZhaoC. Laurent. Interface tailoring for charge injection mitigation in insulators: Different principles and achievements
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM), May 2018, Xi'an, China. pp.17-21, ⟨10.1109/ICPADM.2018.8401277⟩
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hal-02324432v1  Conference papers
C. Villeneuve-FaureG. TeyssedreS. Le RoyL. BoudouK. Makasheva. Interface properties in dielectrics: A cross-section analysis by atomic force microscopy
2018 12th International Conference on the Properties and Applications of Dielectric Materials (ICPADM), May 2018, Xi'an, China. pp.1135-1138, ⟨10.1109/ICPADM.2018.8401246⟩
hal-02005747v1  Conference papers
M. AzibF. BaudoinC. Villeneuve-FaureG. TeyssedreNicolas Binaud et al.  Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, France. pp.1-4
hal-02396181v1  Conference papers
M. AzibF. BaudoinC. Villeneuve-FaureG. TeyssedreN. Binaud et al.  Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D
2018 IEEE 2nd International Conference on Dielectrics (ICD), Jul 2018, Budapest, France. pp.1-4, ⟨10.1109/ICD.2018.8514685⟩