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hal-00674088v1  Book sections
Bernard MultonOlivier GergaudHamid Ben AhmedXavier RoboamStéphan Astier et al.  Etat de l'art des aérogénérateurs
L'électronique de puissance vecteur d'optimisation pour les énergies renouvelables, Ed. NOVELECT - ECRIN, ISBN 2-912154-8-1, pp.97-154, 2002
hal-00713206v1  Journal articles
Vanessa SmetFrançois ForestJean-Jacques HuselsteinFrédéric RichardeauZoubir Khatir et al.  Ageing and Failure Modes of IGBT Modules in High Temperature Power Cycling
IEEE Transactions on Industrial Electronics, Institute of Electrical and Electronics Engineers, 2011, 58 (10), pp.4931 - 4941. ⟨10.1109/TIE.2011.2114313⟩
hal-01700466v2  Journal articles
Roberta RuffilliMounira Bouarroudj-BerkaniP DupuyStéphane LefebvreY Weber et al.  In-depth investigation of metallization aging in power MOSFETs
Microelectronics Reliability, Elsevier, 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, SI:Proceedings of ESREF 2015, 55 (9-10), pp.1966-1970. ⟨10.1016/j.microrel.2015.06.036⟩
hal-01653423v1  Conference papers
T KovaltchoukHamid Ben AhmedBernard MultonJ. Aubry. Houlogénérateurs : projets, verrous et quelques solutions
2016 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM), Oct 2016, Marrakech, Maroc
hal-01681518v1  Conference papers
Mounira Bouarroudj-BerkaniStéphane LefebvreGilles RostaingMichel RiccioRoberta Ruffilli et al.  Surface analysis of smart power top metal: IR thermal measurement and source potential mapping
International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2016 28th, Jun 2016, Prague, Czech Republic. ⟨10.1109/ISPSD.2016.7520861⟩
hal-02180574v1  Conference papers
François BoigeFrédéric RichardeauStéphane LefebvreJean-Marc BlaquièreGerard Guibaud et al.  Ensure an original and safe “fail-to-open” mode in planar and trench power SiC MOSFET devices in extreme short-circuit operation
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 ), Oct 2018, Aalborg, Denmark. pp.598-603, ⟨10.1016/j.microrel.2018.07.026⟩
hal-02180839v1  Conference papers
Frédéric RichardeauFrançois BoigeStéphane Lefebvre. Gate leakage-current, damaged gate and open-circuit failure-mode of recent SiC Power Mosfet : Overview and analysis of unique properties for converter protection and possible future safety management
2018 IEEE International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles & International Transportation Electrification Conference (ESARS-ITEC), Nov 2018, Nottingham, France. pp.1-6, ⟨10.1109/ESARS-ITEC.2018.8607551⟩