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hal-00668827v1
Journal articles
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩ |
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tel-00512333v1
Theses
Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs Networking and Internet Architecture [cs.NI]. Université Paul Sabatier - Toulouse III, 2010. English |
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hal-00591017v1
Journal articles
Frequency Scalable Model for MEMS Capacitive Shunt Switches at Millimeter Wave Frequencies IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2009, 57 (11), p.2824-2833 |
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