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hal-00668827v1  Journal articles
Jinyu Jason RuanNicolas MonnereauDavid TrémouillesNicolas MauranFabio Coccetti et al.  An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 2012, pp.456-461. ⟨10.1109/TIM.2011.2161937⟩
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tel-00512333v1  Theses
Jinyu Jason Ruan. Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs
Networking and Internet Architecture [cs.NI]. Université Paul Sabatier - Toulouse III, 2010. English
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hal-00591017v1  Journal articles
Vincent PuyalDaniela DragomirescuChristina Villeneuve-FaureJinyu Jason RuanPatrick Pons et al.  Frequency Scalable Model for MEMS Capacitive Shunt Switches at Millimeter Wave Frequencies
IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2009, 57 (11), p.2824-2833