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hal-01571054v2  Conference papers
A LantreibecqJean-Philippe MonchouxE PihanMaxime MarieMarc Legros. Subgrains, micro-twins and dislocations characterization in monolike Si using TEM and in-situ TEM
Extended Defects In Semiconductors 2016 (EDS 2016), Sep 2016, Les Issambres, France
hal-02355126v1  Journal articles
J. KacherC. KirchlechnerJ. MichlerE. PolatidisR. Schwaiger et al.  Impact of in situ nanomechanics on physical metallurgy
MRS Bulletin, Cambridge University Press (CUP), 2019, 44 (06), pp.465-470. ⟨10.1557/mrs.2019.124⟩