R. , A. Et-alalb04, and ]. H. Albrecht, Can nanoindentation help to determine the local mechanical properties of microelectronic materials? A state-of the art review Les semiconducteurs de puissance -De la physique du solide aux applications A chemical sensor based on a microfabricated cantilever array with simultaneous resonance-frequency and bending readout Effect of fluids on the Q factor and resonance frequency of oscillating micrometer and nanometer scale beams Formulas for natural frequency and mode shape Temperature cycling and thermal shock failure rate modeling Versatile microscopic profilométre-vibrometer for static and dynamic characterization of micromechanical devices Finite element method analysis of freestanding microrings for thin film tensile strain measurements Fatigue crack evolution in D16AT aluminum alloy specimens under alternatively bendingNon linear 3D electrothermal investigation on power MOS chips Modeling and analysis of metal interconnect resistance of power MOSFETs with ultra low On-resistance Residual stress and strains of highly textured ZrN films examined by X-ray diffraction methods Analysis of tip deflection and force of a bimetallic cantilever microactuator, Thermoelastic damping in trench-refilled polysilicon resonator TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference Proceedings of 6th IEEE Electronics Packaging Technology Conference Physical review (E69) IEEE International Reliability Physics Symposium 35th Annual Proceedings The Third Russian-Korean International Symposium on Science and Technology Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting IEEE International Symposium on Power Semiconductor Devices and IC'sCHU63] W.H.Chu, Technical report number 2, pp.324-327, 1981.

]. T. Microelectronic-reliabilitycly01, P. Clyne, C. Withers, J. Comte, . Von et al., Microprobe-type measurement of Young's modulus and Poisson coefficient by means of depth sensing indentation and acoustic microscopy In situ electrostatic microactuators for measuring the Young's modulus of CMOS thin films Sur la détermination des propriétés mécaniques des matériaux pour les applications MEMS et MOEMS Current handling and thermal considerations in a high current semiconductor switch package Temperature cycling acceleration factors for aluminum metallization in VLSI applications Hooke's law and fatigue limits in micromechanics Highsensitivity surface micromachined structures for internal stress and stress gradient evaluation, International Rectifier technical papers International Reliability Physics Symposium 28th Annual ProceedingsFAN99] W.Fang et al " On the buckling behavior of micromachined beams, pp.653-667, 1990.

F. W. Fang, J. A. Wickertfeng, and H. D. Liu, Comments on measuring thin film stresses using bilayer micromachined beams Generalized formula for curvature radius and layer stresses caused by thermal strain in semiconductor multilayer structures Mechanical stress as a function of temperature in Aluminum films, J.Micromech. Microeng. J.Micromech. Microeng. J. Applied Physics IEEE Transactions on Electron Devices Mechanics of Materials, vol.5435, issue.95, pp.236-244, 1983.

. Kent, A. Bostonhao, F. Erbil, . E. Ayazihat84-]-j, ]. D. Hatchhei95 et al., An analytical model for support loss in micromachined beam resonators with in-plane flexural vibrations Properties and physical metallurgy On the mechanical strength of freestanding and substrate-bonded Al thin films Application of dynamic techniques for accurate determination of silicon nitride Young's moduli Damping characteristics of beam-shaped micro-oscillators Engineering vibration A review of measurement techniques for the thermal expansion coefficient of metals and alloys at elevated temperature The intrinsic stress of polycrystalline and epitaxial thin film, Sensors and Actuator American Society for Metals Journal of Applied Physics IEEE Transducers Sensors and Actuators Measurement Science and Technology J, vol.77812, issue.109 49, pp.156-164, 1984.

P. Lemaitre, J. L. Chabochelif00-]-r, M. L. Lifshitz, . [. Roukes, W. Lin et al., Mécanique des matériaux solides Thermoelastic damping in micro-and nanomechanical systems " ; Physical Review Structural dynamics of microsystems-current state of research and future directions Reliability of Power Cycling for IGBT Power Semiconductor Modules Fatigue of polycrystalline silicon for microelectromechanical system applications: crack growth and stability under resonant loading condition A general model for age acceleration during thermal cycling, Thermal stress and low cycle fatigueNAC85] J.A Nachlas, pp.9519-955061, 1912.

N. Nikanorov, S. P. Yu, A. V. Burenkov, . Stepanov, . Sov et al., Experimental and theoretical investigations on nonlinear resonances of composite buckled microbridges » Heavy Al ribbon interconnect: An alternative solution for hybrid power packaging Wensyang Hsu, « A microstructure for in determination of residual strain » Amortissement visqueux d'un résonateur mécanique en environnement gazeux, Quality and Reliability Engineering International Proc. 37th Int. Symposium on Microelectronics, IMAPSPAN99] C.S.PanPER02_a] O.Perat, J.M.Dorkel, E.Scheid, P.Temple-Boyer, Y.S.Chung, pp.3-686, 1971.

M. Lavigne, P. Zecri, and . Tounsi, Characterization method of thermomechanical parameters for microelectronic materials Méthodologie de caractérisation de paramètres thermomécaniques de matériaux pour la microélectronique, Microelectronics Reliability, vol.42, issue.7, pp.1053-1058, 2002.

[. Puigcordé, A. Vilà, J. R. Morantecheng, R. R. Keller, J. D. Mccolskey et al., Thermal fatigue modelling of micromachined gas sensor Tensile properties of free standing aluminium thin film A temperature sensing device Le nanoindenteur, un outil pour la micro caractérisation des matériaux issus des technologies MEMS " , 2ème journées du RTP Fiabilité des composants et packaging Influence de la prise en compte d'un état mécanique résiduel sur la modélisation d'un assemblage de puissance Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope Effect of the substrate on the determination of thin film mechanical properties by nanoindentation Semi analytic model for thermal fatigue of die attach in Power electronic building blocks " CALCE Electronic Products and Systems Consortium Thermoelastic damping in micro beam resonator The effect of residual stress on the deformation of semicircular micromachined beam, Méthodes de microscopie interférométrique 3D statiques et dynamiques Thèse de doctorat de l'université Parsi sud XI Designing with piezoelectric transducers: Nanopositioning fundamentals, Physik Instrumente (PI) Thermoelastic damping for the, pp.275-281, 1998.

R. [. Wortman, . [. Evans, T. J. Wylde, R. Hubbard, R. Yahiaoui et al., Young's Modulus, Shear Modulus, and Poisson's Ratio in Silicon and Germanium Elastic properties and vibration of micro-machined structures subject to residual stresses Proceeding of the IEEE Canadian conference on electrical and computer engineering shaw conference center Etude par microvibrométrie de films minces et de dispositifs micromécaniques Vibrométrie interférométrique continue et stroboscopique : Application à la caractérisation des modes de vibrations de dispositifs micromécaniques, plane ring vibration of thin silicon rings Thèse de doctorat de l'université Parsi sud XIYAN00] Jinling Yang Mechanical behavior of ultra thin microcantilevers " ; Sensors and Actuators 82, pp.266-285, 1965.

T. [. Yassumura, E. M. Stowe, T. Chow, T. Pfafman, B. Keny et al., Quality factors in micron- and submicron-thick cantilevers, Journal of Microelectromechanical Systems, vol.9, issue.1, pp.9-17, 2000.
DOI : 10.1109/84.825786

Z. [. Ye, J. H. Zhou, J. Zhang, K. L. Yaozhang, and . Turner, Determination of the mechanical properties of microstructuresA-50) 750-754 « Pressure-dependent damping characteristics of micro silicon beam resonators for different resonant modes » Internal friction in solids, Sensors and Actuators IEEE Sensors Phys. Rev, issue.52, pp.0-7803, 1937.

J. Reynes, A. Deram, E. Marty, and J. B. Sauveplane, A temperature sensing device, 2007.

J. B. Sauveplane, P. Tounsi, E. Schied, and X. Chauffleur, Smart 3D finite element modelling for the design of ultra low On-resistance MOSFET

J. Sauveplane, Caractérisation de l'évolution des paramètres mécaniques d'un film métalliques déposé en couche mince, GEET, 2006.

J. Sauveplane, Microsystèmes bicouches dédiés à la détermination des paramètres mécaniques des matériaux utilisés en microélectronique, JNRDM, 2004.