Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests

Sonia Ben Dhia (1) , Alexandre Boyer (1) , Binhong Li (1) , Amadou Ndoye Cisse (2)

1 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
2 LATTIS - Laboratoire Toulousain de Technologie et d'Ingénierie des Systèmes

Presented is an original study about the effects of integrated circuit aging on electromagnetic emission and immunity to radio frequency interferences. For the first time an electromagnetic compatibility (EMC) qualification procedure is proposed to quantify the EMC level variation over the full lifetime of a component. Results presented show non-negligible variations of the emission and immunity thresholds after accelerated life tests, which could seriously deteriorate EMC margins required to ensure compliance with standard EMC levels.

Mots clés: Integrated circuits; Electromagnetic Compatibility; Aging; Accelerated lifetime tests

Domaines: Electronique

Sonia Ben Dhia, Alexandre Boyer, Binhong Li, Amadou Ndoye Cisse. Characterisation of electromagnetic compatibility drifts of nanoscale integrated circuit after accelerated life tests. Electronics Letters, 2010, 46 (4), p. 278-280. ⟨10.1049/el.2010.2885⟩. ⟨hal-00669745⟩