Alexandre Boyer, Sonia Ben Dhia. Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission.
2013 9th Intl Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013), Dec 2013, Nara, Japan. pp.190-195,
⟨10.1109/EMCCompo.2013.6735199⟩.
⟨hal-00945301⟩