Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films

Magali Putero (1) , Benjamin Duployer (2) , Ivan Blum (1) , Toufik Ouled-Khachroum , Marie-Vanessa Coulet (1) , Carine Perrin , Eric Ziegler (3) , Dominique Mangelinck (1) , Christophe Muller (1)

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 CIRIMAT - Centre interuniversitaire de recherche et d'ingenierie des matériaux
3 ESRF - European Synchrotron Radiation Facility

Domaines: Matériaux

Magali Putero, Benjamin Duployer, Ivan Blum, Toufik Ouled-Khachroum, Marie-Vanessa Coulet, et al.. Combined in situ x-ray scattering and electrical measurements for characterizing phase transformations in nanometric functional films. Thin Solid Films, 2013, 541, pp.21-27. ⟨10.1016/j.tsf.2012.11.131⟩. ⟨hal-01951266⟩