Phase noise in SiGe HBT amplifiers and applications
Résumé
Amplifier residual phase noise, as a tool to study nonlinear noise in transistors : 1) Measurement technique, 2) Specificity of the characterization of SiGe devices, 3)Residual phase noise modelling of SiGe transistors. Application to the design of a two stages low phase noise SiGe amplifier. Application to the phase noise characterization and modelling of new types of microwave frequency stabilization devices : FBAR resonators and optical resonators.
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