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Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

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https://hal.archives-ouvertes.fr/hal-01826031
Contributor : Florian Bugarin <>
Submitted on : Tuesday, November 24, 2020 - 5:53:29 PM
Last modification on : Tuesday, December 8, 2020 - 4:24:21 PM
Long-term archiving on: : Thursday, February 25, 2021 - 9:00:20 PM

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Menouar Azib, Fulbert Baudoin, Nicolas Binaud, Christina Villeneuve-Faure, Florian Bugarin, et al.. Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution. Journal of Physics D: Applied Physics, IOP Publishing, 2018, 51 (16), ⟨10.1088/1361-6463/aab286⟩. ⟨hal-01826031⟩

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