Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution

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https://hal.archives-ouvertes.fr/hal-01826031
Contributor : Florian Bugarin <>
Submitted on : Thursday, June 28, 2018 - 10:08:47 PM
Last modification on : Thursday, December 5, 2019 - 9:54:07 PM

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M Azib, Fulbert Baudoin, Nicolas Binaud, F Villeneuve-Faure, Florian Bugarin, et al.. Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution. Journal of Physics D: Applied Physics, IOP Publishing, 2018, 51 (16), ⟨10.1088/1361-6463/aab286⟩. ⟨hal-01826031⟩

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